Electrical testing apparatus



Jan. 12, 1965 D. R. swAN ELECTRICAL TESTING APPARATUS 6 Sheets-Sheet 1 Filed Aug. 9, 1962 INVENTOR.

DEAN R. SWAN BY MC Am W ATTORNEYS u as A A Jan. 12, 1965 D. R. swAN ELECTRICAL TESTING APPARATUS 6 Sheets-Sheet 2 Filed Aug 9,. 1962 mmw INVENTOR.

DEAN R. swAN M, m /wt Jan. 12, 1965 D. R. swAN ELECTRICAL TESTING APPARATUS 6 Sheets-Sheet 3 Filed Aug. 9, 1962 FIG. 4

INVEN'T OR.

DEAN R. SWAN BY @MAQ 6am fw ATTORNEYS Jan. 12, 1965 D. R. swAN 3,165,674

ELECTRICAL TESTING APPARATUS Filed Aug. 9, 1962 6 Sheets-Sheet 4 l 68 INVENTOR.

DEAN R. SWAN BY Flcse WWW" ATTORNEYS Jan. 12, 1965 D. R. swAN ELECTRICAL TESTING APPARATUS 6 Sheets-Sheet 5 Filed Aug. 9, 1962 INVENTOR.

DEAN R, swAN M, m/w

ATTORNEYS Jan. 12, 1965 D. R. swAN 3,165,674

ELECTRICAL TESTING APPARATUS Filed Aug. 9, 1962 6 Sheets-Sheet 6 @Q4/ 1441. 1.4 4 44 (IJ/.

i n ,52 25o I 222 E! e. "lll/ .444 l2/Ilm FIG. I6

F|G.l7

,.ngvENTon DEAN R. swN

BY f

ATTORNEYS UnitedStates Patint l Filed Aug. 9, 159612, Ser. No. 215,836 v6 Ciaims. l (Cl. S17-lill) This invention relates generally to electrical test equipment and specifically to.. an apparatus for the testing of large groups of electronic components such as rectiiiers, capacitors, resistors, semiconductors or the like, in their normal operating environment or under simulated eX- treme temperature conditions.

In the manufacture or assembly of electronic components, it is necessary that the characteristics of each unit conform to stated specifications. It is therefore essential that components be individually tested to determine their characteristics. eiliective tests to gauge the values of these characteristics is a projected life test wherein the components are tested for periods of 24 hours.V This is commonly referred to as a burn-in testing procedure. Each individual component is manually tested by causing current to flow andtaking readings. on a meter.V

It has been found that one of the most.

Additionally, due to recent advances in the miniaturizadeveloped for testing'equipment on which multiples of components can be tested simultaneously in their shipping trays thereby eliminating manual handling and Vits tendency to injure the delicate component leads. Furthermore, where large groups of components are to be tested, manual attachment of the external leads to a current source and to an external meter is laborious and time consuming.

Therefore,V it'is an object of this invention to provide an apparatus capable of establishing simultaneous contactv with a plurality of electronic components so as: to enable electrical characteristics to be measured.

It is a further object of this invention to `provide an electrical contact making. apparatus in which uniform Contact pressure is` applied to eachk of the individual components. n f v It isa further 'object of this invention to provide an electriealcontact making apparatus which will test'large groups of .electronic components in their shipping trays` yeteiectively dissipate the heat which is generated.

Y It is another object of this invention to provide/an electrical contact making apparatus in which electrical Contact may be' established simply and quickly between the componentleads and the power source and-Which will remain inthis'state for sustained periods ottime.

' It Vis another object of this invention'to'provide electrical testing apparatus in which electricalk contact mayV bemade simultaneously to a large groupof components by the actuation of afsingle control lever. 'j

- It is' another object* of thisinvention' to provide cornpartment'ed trays adapted to maintain components in an aligned separated condition for testing'and shipping purposes.

Itis another object'of this invention to provide electrical l testing apparatus in which components maybe subjected.

to extreme environmental conditions.

It isanother object of this invention to provide *an` lhh'm Patented 3511.12, 1h65 ICS electrical testing apparatus in which a plurality of components can be scan tested beforeand after a sustained lite test.

Broadly stated,y the combined features of this invention constitute an electrical testing .apparatus which will accommodate stacked layers of component shipping trays containing a plurality of aligned electronic components between alternate banks of resilient wiper contacts which may be compressed so as to maintain contact with the component leads thereby allowing the tlow of electrical energy from an outside source.

To the accomplishment of the foregoing related ends, the present invention then consists of the means hereinafter fully described and particularly pointed out in the claims, the annexed drawing and the followingdescription setting forth in detail certain means by whiclrto carry out the invention, such disclosed means illustrating, however, but one of the various ways in which the principle of the invention may be employed.

in the drawings: f FiG. l is a view in perspective of the electrical testing apparatus ofthis invention with a plurality of vertically stacked component trays containing components inserted therein, with the apparatus being in the uncompressed state;

FIG. 2Vis a view in perspective similar to FIG. l with the apparatus in its compressed state;

FIG. 3 is a view in front elevation partly in' section,

of one bank of resilient wiper contacts positioned over a component tray.

FIG. 4 is a View in front elevation partly in section component shipping tray.

tray.

FlG. `8 is aV view in side elevation of the component shipping tray.

FIG. 9 is a View in front elevation of the component" shipping tray. Y

FIG. l0 is a view in perspective of the resistor bank jig. '.FIG. ll.is an enlarged View of-the resistor contacts.

v FIG. l2 is an enlarged viewof modified resistor con-v tacts.

FIG. 13l is a view in perspective fof the resistor bank` jig positioned atop the electrical testing apparatuswith the resistors electrically connected to the electronic cornponents. Y

^ FIG. 14 is aview iny perspective of' the illustrating the locking features.

FG. l5 is va View in section of a modified form of this invention in-.the .open position. y

FIG. 16' is a view in section oi-y the modified form of this invention in the closed position.

FIG. i7' is a view inr of the wiper contacts.

FIG. i8 isa View in side elevation partly brokenaway of a modified form of the component tray.

Reference is now made to the drawings', wherein an illustrated Aembodiment of the electricalrtesting apparatus made inV accordance with the presentinvention and gen1 erally designated bythe reference numeral lil'is shown. The essential elements of the electrical testing apparatus litinclude a rectilinear base plate l2 and vertical guide posts yiti extending upwardly from the four base plate corners. A` coverL plate i6 yis positioned on the guide posts i4 and secured thereto by nut members 1S whichA broken away ofy the 'l FIG. 7 is a top plan View of the component shipping` test apparatus perspective partly broken away' are in engagement with the threads of the guide posts Positioned about the guide posts 14 and supported thereon are a plurality of rectilinear shelf plates 22 which are maintained in spaced relation to each other by a plurality of coil springs 24 mounted concentric with the guide posts 14.

Referring to FIG. 3, the upper surface 26 of shelf plate 22 has a pair of longitudinally extending ange members 2S which are adapted to cooperate with the side edges 29 of the component tray 3d in a manner to be subsequently described more fully. The lower surfaces 27 of shelf plates 22 have a'plurality of longitudinally aligned downwardly depending wiper contacts 32 which are spaced from the lower surfaces 27 of the shelf plates 22 by bracket members 34 which are riveted or secured to the the undersurface ofthe shelf plates 22 by attaching members 36. Each of the bracket members 34 include radially extending ns 38 which are longitudinally spaced from each other to allow a flow of air therebetween. Adjacent the edges 4i) of the fins 38 are formed apertures 42 which are adapted to secure leads extending from an external source. As illustrated in FIG. 3, there are two longitudinal rows of facing brackets 34, each bracket having a downwardly depending wiper Contact 32. Each of the wiper contacts 32 comprise a laterally extending portion 44 having one edge 46 secured to the bracket 34, a downwardly depending'portion 48 with the tip 59 formed into an arcuate surface 51.

'In EIGS. 6 through 9 there is illustrated a component tray which is adapted for use with testing apparatus 10. Component tray 30 is formed of an insulating material such as silicon glass which is highly resistant to heat deformation. A series of longitudinally aligned laterally extending grooves 52 is formed inthe tray which is bifur-` cated by a longitudinally extending central well 54l Equally spaced from and disposed on either side of the central well 54 is a pair of `longitudinally extending scanninggrooves 56. As illustrated in FIG. 8, the walls 58 f plate 16 and the uppermost shelf plate 22. The compression plate 72 has a rectilinear configuration and is supported by and adapted for axial movement along the guide posts 14 in a manner similar to the shelf plates 22. As

shown in FIG. 14, an upper link member 74 is pivotallyY secured to the undersurface 76 of the cover plate 16 so as toextendvangularly downward therefrom. A lower linkmember 78 extends angularly upward from the upper surface 80 of the compression plate 72. The free ends of each pair of link members are joined together byV a pivot pin 82. The lower link member 78 iskeyed lto a longi- Vtudinally extending shaftv 84 which is supported on the upper surface 80 of the, compression plate '72 by a pair of bearing blocks 86. Another set of link members is longitudinally spacedfrom the rst set and is similarly attached to the cover plate 16 and keyed to the longitudinally extending shaft 84. The shaft 84 extends outwardly through spaced relation by spacer members 96 positioned on ver-- tically extending shafts or supports 98. The stacked decks 94 are held in assembly by nut members MPO which are in threaded engagement with the upper ends of the shafts 98. As illustrated in FIGS. l() and 1l, the upper surface 102 and lower surface 186 of each of the decks 94 have a plurality of longitudinally alignedrlaterally spaced terminal posts 104 to provide a means for securing a plurality of longitudinally aligned resistors. Electrical leads 108 extend downwardly from the terminal posts 194 and are engaged in the apertures 42 of brackets 34. FIG. 13 illustrates the relative position of the testing jig 92 positioned on thermal insulated support 110 which prevents the heat generated by the resistors positioned on the testing jig from radiating downward and affecting the characteristics of the units being tested on plate members 2.2.

In the operation of the apparatus, a plurality of components '76 are positioned in the laterally extending grooves 2 of trays 3i) so that the lead wires extend into the grooves S2 with the main body ofthe component 70 lying Within the central groove 54. The component trays 3@ are inserted at various levels of the apparatus engaging the shelf plates 22. This is accomplished by sliding the side edges 29 ofthe component tray 80 beneath and between facing flange members 28. This aligns the Vlongitudinal grooves 52 under the downwardly depending wiper contacts 32. Tray guides 112 extend forwardly from one edge of the shelf plates 22 to prevent tilting of the cornponent trays 30 during insertion and to eliminate possible damage to the downwardly depending wiper contacts 32.

Stop members not shown are positioned on each of the upper surfaces of the shelf plates 22 to provide a means for longitudinal alignment of the component trays 80 thus positioning each of the grooves 52 directlybeneath a pair of downwardly depending wiper contacts 32. With all of the component trays 30 arrangedrin stacked relationship within the apparatus, the lever 90 is rotated downwardly imparting a rotary motion to the longitudinally extending shaft 84 which causes the link members 74 and 78 to move `so as to attain a straight vertical alignment and remain locked in that position. In this manner the compression plate 72 is forced away from the cover plate 16 compressing the coil springs V24. The shelf plates 22 are forced downwardly so that the wiper contacts 32 enterY into a wiping and sliding engagement with the component leads 70 which lie disposed within the grooves 52. The

v wiper contacts 32 are formed of a resilient material.

the front Wall 88 of the compression plate 72 and has an angularly extending operating lever 9750 keyed thereto.

As illustrated in FIGS. l0 throughilS, a testing jig 92 is adapted for use with the electrical test apparatus 10 to provide a suitable means of emplacing `a plurality-of resistors or the like in the electrical line between the units being tested and the recording meter. The testing jig 92 comprises a plurality of stacked decks 94 which are ver-r` tically spacedrfromeach other and maintained in this jig 92 through the wiper contacts 32 andy through each of the components to a suitable recording meter (not shown). n

n A modified form of the invention is illustrated in FIGS.

15-18. The modified form is adapted for testing corn-A ponents having leads extending from only one end thereof. Y

In FIG. 15, the apparatus is shown in open position with -shelf plate 222 disposed above component tray 230;

`Components 270 are arrayed within tray 230. A plurality of wiper contacts 232 depend downwardly from the undersurface of the shelf platesf222 having upwardly inclined end portions 250. The wiper contacts 232 are secured to the shelf plates 222 by brackets 234which are integral therewith.v Extending laterally outward from the edge of the brackets 234l are fins 238 which are secured to the undersurface of the shelf plates 222 byV attaching members 236. The `tins 238 in this modified form are inclined downwardly atan angle to provide agconduit for the passage of cooling .air asvshown in FIG. 16.

' In FIGS. l5, 16 and- 1.8 there is shown a modified form of the component Ytray 230 which consists primarily of a heat resistant material such as silicon glass or the lilre. The laterally extending grooves 259 are separated from each other by similar grooves 261 which are cut to a different depth to accommodate the third lead of the component 278. Individual well portions 271 are formed at one side of component tray 230 to accommodate the components 270.

In operation the modified form of the invention is similar to the basic form. The trays 230 have a plurality of the components 270 disposed within the wells 271 with their leads resting in the grooves 259 and 261. The component trays 230 are positioned on the shelf plates 222. Upon compression of the shelf plates 222, the wiper contacts 232 enter into a wiping and sliding engagement with the leads which are positioned within the grooves 259 and 261. Electrical energy is allowed to ow through the wiper contacts 232 so as to complete the circuit through the components 270 and suitable readings are taken on an external meter (not shown).

Referring again to the preferred form of the invention, the testing procedure is continued for a specified period of time and at the completion thereof the wiper contacts .32 are disconnected from the leads of the components 70 by releasing the locking action of the link members 74 and 78. This is accomplished by means of a counter-clockwise rotation of the lever 90. The release of the locking action allows the springs 24 to raise the compression plate 72 and each of the shelf plates 22 upwardly away from the component trays 30 to provide an adequate clearance for the trays 30 to be withdrawn from the testing apparatus.

As is shown in FIG. 7, a pair of scanning grooves 56 are formed in each of the component trays 30 to provide a relatively simple guideway along with the leads of an electrical testing instrument may be passed so` as to quickly detect components which have failed during the testing period.

lt will readily become apparent to one skilled in the art that the provision of the ns 38 on the undersurface of the shelf plates 22 ensures the existence of an air space between the upper surface of the component trays 30 and the undersurface of the shelf plates 22. By providing this lair space, an adequate amount of cooling air is allowed to ow laterally across the upper surface of the components 70 during the testing period which effectively conveys away lany undesirable heat that would have an effect upon the accuracy of the test. This air cooling action is of even more importancewhen the components are tested under extreme temperature conditions. Temperatures are raised to 250 to 300 degrees centigrade. With this level of heating, lateral circulation of air is facilitated by the provision of the fins 38 which maintain a clearance between the undersurface of the shelf plates 22 and the component trays 30.

Upon completion of the test the components 70 are retained within the trays 30. The lclip members 64 remain snapped over the tray ends 68 facilitating the shipment of the tray unit to a storage area or directly to the customer without the individual handling of the components 70.

Since certain other obvious modifications may be made in the device without departing from the scope of the invention, it is intended that all matter contained herein be interpreted in an illustrative and not in a limiting sense.

I claim: v

l. An electrical testing apparatus comprising: a base plate; guide posts mounted in said base plate and extending upwardly therefrom; a cover plate overlying said base plate and secured to the top ends of said guide posts; a plurality of shelf plates horizontally disposed between said base plate and said cover plate, said shelf plates connected to and vertically movable on said guide posts; spring means co-axially carried on said guide posts for resiliently spacing said shelf plates from each other; component trays removably mounted upon the upper surfaces of said shelf plates, each said tray having aligned grooves in which a multiplicity of electrical components are carried and fastening means for retaining the components in said tray grooves; a multiplicity of wiper contacts mounted on and depending from the lower surfaces of said shelf plates; each said wiper contact positionecl over a groove in said component tray; a compression plate horizontally disposed between said uppermost shelf plate and said cover plate, said compression plate connected to and vertically movable on said guide posts; and means for driving said compression plate downward to bring said wiper contacts into electrical contact with the tray-held components whereby the components can be electrically tested.

2. Apparatus of claim 1 wherein said driving means includes a linkage operating shaft mounted between said cover plate and said compression plate and an actuating lever therefor whereby a single throw of said lever establishes electrical contact between said wiper contacts and the electrical components.

3. Apparatus of claim 1 wherein said component tray and associated fastening means is independently useable as a shipping container.

4. Apparatus of claim 1 wherein said wiper contacts have thermal fins formed integral therewith for rapid dissipation of heat.

5. Apparatus of claim 1 wherein each said shelf plate is maintained at Ian equal distance from its upper and lower adjacent shelf plates by said spring means, and wherein said equal distance is quantitatively varied by said driving means.

6. Apparatus of claim 1 wherein said shelf plates have guide slots, and said component trays have corresponding flanges for slidable mounting on said shelf plates.

References Cited by the Examiner UNITED STATES PATENTS 2,293,127 8/42 Fishack et al. 339-18 2,603,683 7/52 Armbraster et al. 174-59 2,802,189 8/57 Bishop et al. 339-18 2,918,648 12/59 Ludman et ral 324-158 3,058,440 10/62 Berry 339-17 JOHN F. BURNS, Primary Examiner. 

1. AN ELECTRICAL TESTING APPARATUS COMPRISING: A BASE PLATE; GUIDE POSTS MOUNTED IN SAID BASE PLATE AND EXTENDING UPWARDLY THEREFROM; A COVER PLATE OVERLYING SAID BASE PLATE AND SECURED TO THE TOP ENDS OF SAID GUIDE POSTS; A PLURALITY OF SHELF PLATES HORIZONTALLY DISPOSED BETWEEN SAID BASE PLATE AND SAID COVER PLATE, SAID SHELF PLATES CONNECTED TO AND VERTIALLY MOVABLE ON SAID GUIDE POSTS; SPRING MEANS CO-AXIALLY CARRIED ON SAID GUIDE POSTS FOR RESILIENTLY SPACING SAID SHELF PLATES FROM EACH OTHER; COMPONENT TRAYS REMOVABLY MOUNTED UPON THE UPPER SURFACES OF SAID SHELF PLATES, EACH SAID TRAY HAVING ALIGNED GROOVES IN WHICH A MULTIPLICITY OF ELECTRICAL COMPONENTS ARE CARIED AND FASTENING MEANS FOR RETAINING THE COMPONENTS IN SAID TRAY GROOVES; A MULTIPLICITY OF WIPER CONTACTS MOUNTED ON AND DEPENDING FROM THE LOWER SURFACES OF SAID SHELF PLATES; EACH SAID WIPER CONTACT POSITIONED OVER A GROOVE IN SAID COMPONENT TRAY; A COMPRESSION PLATE HORIZONTALLY DISPOSED BETWEEN SAID UPPERMOST SHELF PLATE AND SAID COVER PLATE, SAID COMPRESSION PLATE CONNECTED TO AND VERTICALLY MOVABLE ON SAID GUIDE POSTS; AND MEANS FOR DRIVING SAID COMPRESSION PLATE DOWNWARD TO BRING SAID WIPER CONTACTS INTO ELECTRICAL CONTACT WITH THE TRAY-HELD COMPONENTS WHEREBY THE COMPONENTS CAN BE ELECTRICALLY TESTED. 